SAEL

TDLS 8200

TDLS 8200 Probe Type Tunable Diode Laser Spectrometer

Yokogawa’s new TDLS8200 continues to house all of the industry’s leading features from the TDLS8000, but now only requiring a single-flange installation. An in-situ measurement with a probe removes the requirement for sample extraction and conditioning and can be used in a variety of aggressive process conditions. Built upon Yokogawa’s second generation of TDLS analyzers, the platform still retains its improved reliability, ease of installation, and reduced maintenance requirements, but now does so with a lower total installed cost for such as O2, CO/CH4 measurement

IEC 61508     SIL 3

Assessed By:

   IEC 61508 Certificate   Assessment Report  

Last Updated: Mon, March 18, 2024