IEC 61511:2016 has strong language requiring failure rate data used in SIF verification to have a good pedigree. This language comes as a defense against extremely low failure rate data published by some manufacturers. This webinar will explain the sources of failure rate data and the tradeoffs in various methods being used to generate that data. A multi-method approach will be explained which can provide realistic, application specific failure rate data. Field failure statistical limits will be presented.